Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/55062
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dc.contributor.authorLin, H.-
dc.contributor.authorUng, B.-
dc.contributor.authorFischer, B.-
dc.contributor.authorMickan, S.-
dc.contributor.authorAbbott, D.-
dc.date.issued2009-
dc.identifier.citationProceeding of the 34th International Conference on Infrared, Millimeter, and Terahertz Wave, 2009: pp 1-2-
dc.identifier.isbn9781424454174-
dc.identifier.urihttp://hdl.handle.net/2440/55062-
dc.description.abstractMany techniques have been proposed in the literature with an aim of breaking the diffraction limit for THz imaging. The thin crystal in electro-optical based technique has been reported to generate THz power enhancement. This, however, is counter-intuitive as thicker crystals provide a greater volume for optical rectification and hence should generate more power. This paper therefore investigates THz optical rectification with thin crystal experimentally.-
dc.description.statementofresponsibilityHungyen Lin, Benjamin Seam Yu Ung, Bernd M. Fischer, Samuel P. Mickan and Derek Abbott-
dc.language.isoen-
dc.publisherIEEE-
dc.source.urihttp://dx.doi.org/10.1109/icimw.2009.5325560-
dc.titleEffects of crystal thickness in localized terahertz generation via optical rectification in ZnTe - preliminary investigation-
dc.typeConference paper-
dc.contributor.conferenceIRMMW - THz 2009 (34th : 2009 : Korea)-
dc.identifier.doi10.1109/ICIMW.2009.5325560-
dc.publisher.placeCD-
pubs.publication-statusPublished-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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