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https://hdl.handle.net/2440/129998
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Type: | Journal article |
Title: | Characteristics of effective-medium-clad dielectric waveguides |
Author: | Gao, W. Lee, W.S.L. Yu, X. Fujita, M. Nagatsuma, T. Fumeaux, C. Withayachumnankul, W. |
Citation: | IEEE Transactions on Terahertz Science and Technology, 2021; 11(1):28-41 |
Publisher: | Institute of Electrical and Electronics Engineers |
Issue Date: | 2021 |
ISSN: | 2156-342X 2156-3446 |
Statement of Responsibility: | Weijie Gao, Wendy S. L. Lee, Xiongbin Yu, Masayuki Fujita, Tadao Nagatsuma, Christophe Fumeaux ... et al. |
Abstract: | Effective-medium-clad dielectric waveguides are purely built into a single high-resistivity float-zone silicon wafer with their claddings defined by deep subwavelength perforations. The waveguides are substrate-free while supporting both E x 11 and E y 11 modes with low loss and low dispersion. This article extends the investigations of the waveguides by analyzing the dispersion, cross-polarization, and crosstalk together with the characteristics of bends and crossings over an operation frequency range of 220- 330 GHz (WR-3 band). Taking the E x 11 mode as an example, the experimental results show an average measured attenuation coefficient of 0.075 dB/cm and a group velocity dispersion ranging from around ±10 ps/THz/mm across the whole band. A crosstalk level below -10 dB is measured for parallel waveguides with a separation of 0.52λ 0 at 300 GHz. The realized waveguides show a bending loss ranging from 0.500 to 0.025 dB per bend and a crosstalk at crossing below -15 dB from 220 to 330 GHz. Due to the different dispersion characteristics, the E y 11 mode has similar performances but with its operation frequency range reduced to 260-330 GHz. Limited by the measurement setup, a cross-coupling between the E x 11 and E y 11 modes is measured to be below -20 dB over the whole band. This in-depth investigation of effective-medium-clad waveguides will form a basis for terahertz-integrated platforms. |
Keywords: | Optical waveguides; silicon; dispersion; dielectrics; permittivity; crosstalk |
Rights: | © 2021, IEEE |
DOI: | 10.1109/TTHZ.2020.3023917 |
Grant ID: | http://purl.org/au-research/grants/arc/ARC DP180103561 |
Published version: | http://dx.doi.org/10.1109/tthz.2020.3023917 |
Appears in Collections: | Aurora harvest 8 Electrical and Electronic Engineering publications |
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