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Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/69011
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dc.contributor.authorCzerwinski, F.en
dc.contributor.authorRichardson, Andrew Callumen
dc.contributor.authorSelhuber-Unkel, C.en
dc.contributor.authorOddershede, Lene B.en
dc.date.issued2009en
dc.identifier.citationProceedings of SPIE, 2009; 7400:7400404en
dc.identifier.urihttp://hdl.handle.net/2440/69011-
dc.description.statementofresponsibilityFabian Czerwinski, Andrew C. Richardson, Christine Selhuber-Unkel, and Lene B. Oddershedeen
dc.publisherSPIEen
dc.rights© 2009 COPYRIGHT SPIE--The International Society for Optical Engineering. Downloading of the abstract is permitted for personal use only.en
dc.subjectoptical tweezers; optical trapping; noise; drift; calibration; Allan variance; piezo stage; nanorodsen
dc.titleQuantifying and pinpointing sources of noise in optical tweezers experimentsen
dc.typeConference paperen
dc.contributor.schoolSchool of Chemistry and Physicsen
dc.contributor.conferenceOptical Trapping and Optical Micromanipulation (6th : 2009 : San Diego, California)en
dc.identifier.doi10.1117/12.827975en
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