Adelaide Research & Scholarship
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https://hdl.handle.net/2440/55058
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| Type: | Conference paper |
| Title: | Measurement of linearity in THz-TDS |
| Author: | Withayachumnankul, W. Ung, B. Fischer, B. Abbott, D. |
| Citation: | Proceeding of the 34th International Conference on Infrared, Millimeter, and Terahertz Wave, 2009: pp.1-2 |
| Publisher: | IEEE |
| Publisher Place: | CD |
| Issue Date: | 2009 |
| ISBN: | 9781424454174 |
| Conference Name: | IRMMW - THz 2009 (34th : 2009 : Korea) |
| Statement of Responsibility: | Withayachumnankul, W.; Ung, B.S.-Y.; Fischer, B.M. and Abbott, D.; |
| Abstract: | This article presents an approach to the measurement of the amplitude linearity in terahertz time-domain spectroscopy (THz-TDS) systems. The approach exploits a single wafer of high-purity float-zone silicon to produce multiple Fabry-Perot reflections, which are stepwise attenuated and delayed. Comparison between the theoretical and experimental results can indicate a deviation in linearity. |
| DOI: | 10.1109/ICIMW.2009.5324721 |
| Published version: | http://dx.doi.org/10.1109/icimw.2009.5324721 |
| Appears in Collections: | Aurora harvest Electrical and Electronic Engineering publications |
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