Please use this identifier to cite or link to this item: https://hdl.handle.net/2440/39643
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dc.contributor.authorFerguson, B.-
dc.contributor.authorWang, S.-
dc.contributor.authorGray, D.-
dc.contributor.authorAbbott, D.-
dc.contributor.authorZhang, X.C.-
dc.date.issued2002-
dc.identifier.citationTechnical digest : summaries of papers presented at the Conference on Lasers and Electro-optics : Long Beach Convention Center, Long Beach, California, May 19-24, 2002 / pp. 132.-
dc.identifier.isbn1557527067-
dc.identifier.urihttp://hdl.handle.net/2440/39643-
dc.description.abstractT-ray computed tomography imaging has significant potential in a number of applications. It is capable of reconstructing the 3D structure and frequency dependent far-infrared optical properties of an object. Using the reconstructed material properties different substances may be uniquely identified despite being hidden within other opaque structures. Applications of this technology are foreseen in non-destructive mail/packaging inspection, semiconductor testing, quality control of plastics and certain biomedical applications where the absorption of THz is not prohibitive.-
dc.description.statementofresponsibilityFerguson, B. Shaohong Wang Gray, D. Abbott, D. Zhang, X.-C.-
dc.language.isoen-
dc.publisherOptical Society of America-
dc.relation.ispartofseriesOSA trends in optics and photonics series ; 73-
dc.rightsCopyright 2002, Optical Society of America-
dc.source.urihttp://dx.doi.org/10.1109/cleo.2002.1033523-
dc.titleThree dimensional imaging using T-ray computed tomography-
dc.typeConference paper-
dc.contributor.conferenceConference on Lasers and Electro-Optics (23rd : 2002 : Long Beach, California)-
dc.identifier.doi10.1109/CLEO.2002.1033523-
pubs.publication-statusPublished-
dc.identifier.orcidAbbott, D. [0000-0002-0945-2674]-
Appears in Collections:Aurora harvest
Electrical and Electronic Engineering publications

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