Adelaide Research & Scholarship
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https://hdl.handle.net/2440/16586
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| Type: | Journal article |
| Title: | Simple material parameter estimation via terahertz time-domain spectroscopy |
| Author: | Withayachumnankul, W. Ferguson, B. Rainsford, T. Mickan, S. Abbott, D. |
| Citation: | Electronics Letters, 2005; 41(14):800-801 |
| Publisher: | IEE-Inst Elec Eng |
| Issue Date: | 2005 |
| ISSN: | 0013-5194 1350-911X |
| Statement of Responsibility: | W. Withayachumnankul, B. Ferguson, T. Rainsford, S.P. Mickan, and D. Abbott |
| Abstract: | A simple and precise method based on fixed-point iteration is used to estimate dielectric parameters using terahertz time-domain spectroscopy (THz-TDS). The method converges and gives correct parameters when the sample thickness is greater than 200 mm at a frequency of 0.1 THz or 20 mm at a frequency of 1.0 THz. The technique in validated using measured terahertz data, obtained by probing a sample of high-resistivity silicon. |
| Description: | © 2005 Institution of Engineering and Technology |
| DOI: | 10.1049/el:20051467 |
| Published version: | http://dx.doi.org/10.1049/el:20051467 |
| Appears in Collections: | Aurora harvest 6 Electrical and Electronic Engineering publications |
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